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Alpha Particle Detection in Associated Particle Imaging

The present invention provides improved spatial resolution (100 microns or less) for charge particle detection and/or cold neutron detection with extremely low sensitivity to other radiation such as x-rays or gamma rays. The instrument and method of the present invention defines the time of the event within ~1 nanosecond. Depending on how the invention is implemented the spatial resolution can be larger or smaller than 100 microns as desired. The invention is simpler than existing methods for corresponding applications, and has a higher signal to noise ratio, resulting in lower false detections and higher real detections. Technology necessary to make prototypes is already in place at ORNL.

Global Nuclear Security Technology Div
Oak Ridge National Laboratory
Oak Ridge National Laboratory
Phone: (865) 241-6564
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