• Scanning Probe
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Vertically Aligned Carbon Nanofiber Scanning Probe Microscope Tips Vertically Aligned Carbon Nanofiber Scanning Probe Microscope Tips Disclosure Number 200201208 Technology Summary Eight related methods for fabricating cantilever structures are disclosed. Inventor LOWNDES, DOUGLAS Condensed Matter Sciences Division Licensing Contact SIMS, DAVID L U…

Deep Data in Scanning Probe Microscopy: "G-mode," Getting All The Data During SPM Imaging Deep Data in Scanning Probe Microscopy: "G-mode," Getting All The Data During SPM Imaging Disclosure Number 201403336 Technology Summary The invention relates to Scanning Probe Microscopy and more specifically to information-theory analysis of the cantilever output stream. We introduce a novel con…

General Full Acquisition High-Speed Spectroscopy for Scanning Probe Microscopy General Full Acquisition High-Speed Spectroscopy for Scanning Probe Microscopy Disclosure Number 201503568 Technology Summary The invention relates to scanning probe microscopy and more specifically to an ultra-fast spectroscopy technique to facilitate the observation of fast transient behaviors. Though com…

Electronic Thermometry in Tunable Tunnel Junction Disclosure Number 201202930 Technology Summary The method of the present invention allows a direct measurement of a temperature gradient between two closely spaced conducting bodies, provided the separation gap is small enough to allow quantum electron tunneling and it is adjustable. The method does not re…

Spatially Resolved Quantitative Mapping for Thermal Analysis Using Scanning Probe Microscopy ORNL researchers invented a method that uses band excitation acoustic force microscopy for quantitative mapping of polymeric materials. This technique probes thermomechanical properties and phase transition temperatures of materials at the nanometer scale. Data from this method are important for a variety…

Rapid Functional Recognition Imaging in Scanning Probe Microscopy Rapid Functional Recognition Imaging in Scanning Probe Microscopy Disclosure Number 200802190 Technology Summary A data acquisition, processing, and control method in scanning probe microscopy achieves rapid recognition imaging of local properties and functionality in inorganic, molecular,…

Using adaptive band excitation, ORNL researchers invented new scanning probe microscopy (SPM) techniques that offer improved data acquisition, processing, and control. These techniques enable researchers to carry out functional imaging and manipulation down to the nanometer and atomic scale. The invention can be applied to all force-based scanning probe microscopy techniques, including intermitte…

ORNL researchers developed an innovative imaging method that possesses the imaging capability of scanning near-field ultrasound holography and the chemical specificity of reverse photoacoustic spectroscopy. This imaging method can achieve chemical differentiation with nanometer resolution. Atomic force microscopy is a well established technique for imaging surface features of a nanometer or less.…

Method for Mass Production of Nanoscale Carbon Tips with Cylinder-on-Cone Shape Method for Mass Production of Nanoscale Carbon Tips with Cylinder-on-Cone Shape Disclosure Number 200100903 Technology Summary A method for fabricating nanoscale carbon tips with improved shape is described. The tips have excellent mechanical and thermal stability, while enab…

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Sensingindividualcarbon Contour plot of FE current (in nA) from an isolated VACNC, measured during a raster scan of the 2- m- diam probe at a height of 10 m above the substrate surface and biased at 300 V. The probe was scanned in discrete steps of 2 m with a current measurement taken after each step. Sensing Individual Carbon Nanotube Emissions Probe for mapping field emission from individua…

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