• Scanning Probe Microscopy
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General Full Acquisition High-Speed Spectroscopy for Scanning Probe Microscopy General Full Acquisition High-Speed Spectroscopy for Scanning Probe Microscopy Disclosure Number 201503568 Technology Summary The invention relates to scanning probe microscopy and more specifically to an ultra-fast spectroscopy technique to facilitate the observation of fast transient behaviors. Though com…

Electronic Thermometry in Tunable Tunnel Junction Disclosure Number 201202930 Technology Summary The method of the present invention allows a direct measurement of a temperature gradient between two closely spaced conducting bodies, provided the separation gap is small enough to allow quantum electron tunneling and it is adjustable. The method does not re…

Deep Data in Scanning Probe Microscopy: "G-mode," Getting All The Data During SPM Imaging Deep Data in Scanning Probe Microscopy: "G-mode," Getting All The Data During SPM Imaging Disclosure Number 201403336 Technology Summary The invention relates to Scanning Probe Microscopy and more specifically to information-theory analysis of the cantilever output stream. We introduce a novel con…

ORNL researchers developed an innovative imaging method that possesses the imaging capability of scanning near-field ultrasound holography and the chemical specificity of reverse photoacoustic spectroscopy. This imaging method can achieve chemical differentiation with nanometer resolution. Atomic force microscopy is a well established technique for imaging surface features of a nanometer or less.…

Non-Linear Interaction Imaging and Spectroscopy for Atomic Force Microscopy Non-Linear Interaction Imaging and Spectroscopy for Atomic Force Microscopy Disclosure Number 200802167 Technology Summary Non-linear interaction imaging and spectroscopy (NIIS) for scanning probe microscopy is a fast technique for retrieving both the linear and non-linear compon…

Rapid Functional Recognition Imaging in Scanning Probe Microscopy Rapid Functional Recognition Imaging in Scanning Probe Microscopy Disclosure Number 200802190 Technology Summary A data acquisition, processing, and control method in scanning probe microscopy achieves rapid recognition imaging of local properties and functionality in inorganic, molecular,…

Method for Mass Production of Nanoscale Carbon Tips with Cylinder-on-Cone Shape Method for Mass Production of Nanoscale Carbon Tips with Cylinder-on-Cone Shape Disclosure Number 200100903 Technology Summary A method for fabricating nanoscale carbon tips with improved shape is described. The tips have excellent mechanical and thermal stability, while enab…

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Microcantilever Counter Electrode Electrochemical Sensor in a Three-Electrode Cell Researchers at ORNL have invented a compact, highly accurate system to detect and measure chemicals in solution. The device can be used to detect ions and other electroactive species, hostile biological agents, and protein fragments. The device is a three-electrode cell in which the counter electrode is a microcant…

Adsorption-controlled growth of ferroelectric PbTiO{sub 3} and Bi{sub 4}Ti{sub 3}O{sub 12} films for nonvolatile memory applications by MBE LA-UR-& Title: a-- Author@): Submitted to: Los Alamos N A T I O N A L L A B O R A T O R Y idsorption-Controlled Growth of Ferroelectric pbTi03 and Bi4Ti3OI2 Yms for Nonvolatile Memory Applications by MBE kistopher D. Theis, Penn State Univ…

An NMR investigation of superconductivity and antiferromagnetism in CaFe2As2 under pressure 751- tool LA-UR-09 Approved for public release; distribution is unlimited. Title: I An NMR Investigation of Superconductivity and Antiferromagnetism in CaFe2As2 Under Pressure Author(s): I S.H. Baek, H.O. Lee, S.E. Brown, N.J. Curro, E.D. Bauer, F. Ronning, T. Park, J.D. Thompson Intended for…

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