• Metrology
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Methods for Detection and Quantification of Conductance and Dielectric Permittivity Methods for Detection and Quantification of Conductance and Dielectric Permittivity Disclosure Number 201503548 Technology Summary A device/test structure is described, which enables ac readout of nanoscale dielectric and conduction inhomogeneities and allows overcoming measurement parasitics in nanosca…

: Fact Cards
: Dielectric, Metrology, Nanoscale...

Extending the Range of Turbidity Measurement Using Polarimetry Disclosure Number 201303223 Technology Summary The invention relates to optical characterization of samples. This technology extends the range of turbidity measurement by an order of magnitude or greater, thus permitting characterization/quantification of highly scattering turbid samples unaddressable with current technol…

: Fact Cards
: Metrology, Electronics, Sampling...

Laser-Based Multiplex EGR Probe Based on CO2 Measurements Disclosure Number 201303087 Technology Summary The invention relates to diagnostic devices and methods and more specifically to devices and methods for detecting CO2 in a gas stream. The laser enables many benefits including better sensitivity at higher relevant EGR levels; linear sensitivity over a wide…

: Fact Cards
: Laser, Metrology, Probing...

High-Speed Transmission and Reflection Measurements using Spatial-Heterodyne Interferometry for Complete Inspection/Metrology of Translucent Objects High-Speed Transmission and Reflection Measurements using Spatial-Heterodyne Interferometry for Complete Inspection/Metrology of Translucent Objects Disclosure Number 200301225 Technology Summary A new inter…

Superhydrophobic Anodized Alumina and Method of Making Same Disclosure Number 201202919 Technology Summary The invention relates to surface treatments and more specifically to methods for modifing a standard aluminum anodization process in such a way as to produce a durable superhydrophobic surface. The resulting superhydrophobic anodized alumina surface …

: Fact Cards

An optical system capable of reproducing three-dimensional images was invented at ORNL. This system can detect height changes of a few nanometers or less and render clear, single shot images. These types of precise, high speed measurements are impor- tant for a variety of nanoscience applications. Imaging offers a compelling alternative to convention scanning because it is faster and does not req…

Optical Backscatter Probe for Sensing Particulate Matter To provide emissions information for automotive engines, ORNL researchers developed a technology that enables very rapid measurement of particulate matter in gas emissions. This fiber optic-based probe can be used in engine locations that are typically inaccessible to existing measurement tools. The automotive industry values particulate in…

Emissivity Independent Optical Pyrometer Disclosure Number 201102715 Technology Summary The present invention provides an emissivity independent optical pyrometry technique and apparatus that allows absolute measurements of surface temperature using a non-contact probe. The technique allows surface temperatures between 300 Deg. C and 1400 Deg. C to be mea…

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: Pyrometer, Metrology, Assembly...

Biometric Eye Model and Ray Tracing for Improved Iris Recognition Disclosure Number 201202863 Technology Summary The invention disclosure relates to security systems and more specifically to iris recognition. Iris recognition has been proven to be an accurate and reliable biometric. However, the recognition of non-ideal iris images such as off angle imag…

: Fact Cards
: model, Metrology, Modeling...

Collimating Adaptor for ORTEC High Purity Germanium Detective UT-B ID 201002500 This invention builds on the technology in the well-known ORTEC Detective family of hand-held radiation detecting devices, providing additional shielding from background radiation and repeatability of measurement geometry for improved measurement in the field. The device can be used to make accurate spectral measure…

: Fact Sheets
: Metrology, Radiation, Assembly...
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